Ultrasensitive refractive index sensor based on the resonant scattering effect between double air circular-holes on silicon waveguides.
Ultrasensitive refractive index sensor based on the resonant scattering effect between double air circular-holes on silicon waveguides.
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DOI：
10.1364/oe.21.027796
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发表时间：
2013-11
期刊：
影响因子：
3.8
通讯作者：
Jun-Hwa Song;Bojun Li;Linchun Chen;Xuan Li
中科院分区：
文献类型：
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作者：
Jun-Hwa Song;Bojun Li;Linchun Chen;Xuan Li
最近，我们提出了一个敏感的折射率传感器的设计，通过集成一个圆孔缺陷与蚀刻衍射光栅（EDG）光谱仪的基础上非晶硅光子平台。在本文中，我们将表明，一个更好的灵敏度（~17422 nm/RIU），可以通过使用适当的间隔双圆孔。双孔间隔的传感应用的性能上的影响也被表征。随着间隔的增加，可以发现灵敏度的正弦图案。然而，共振峰的强度（即，传感应用的可检测性）随着间隔的变化而显著地振荡。
Recently, we have proposed a sensitive refractive index sensor design by integrating a circular-hole defect with an etched diffraction grating (EDG) spectrometer based on amorphous silicon photonic platforms. In the present paper, we will show that a much better sensitivity (~17422 nm/RIU) can be obtained by using double circular-holes with an appropriate interval. The influence of the double-hole interval on the performance of sensing applications is also characterized. A sinusoidal pattern of the sensitivity can be found as the interval increases. However, the intensity of the resonant peak (i.e., the detectability for sensing applications) significantly oscillates as the interval varies.