Beyond the Rayleigh criterion: grating assisted far-field optical diffraction tomography.
Beyond the Rayleigh criterion: grating assisted far-field optical diffraction tomography.
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DOI：
10.1103/physrevlett.97.243901
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发表时间：
2006-12
影响因子：
8.6
通讯作者：
A. Sentenac;P. Chaumet;K. Belkebir
中科院分区：
文献类型：
--
作者：
A. Sentenac;P. Chaumet;K. Belkebir
我们提出了一种光学成像系统，其中照明和收集都在远场进行，呈现出优于十分之一波长的分辨率的功率。这是通过将样品沉积在周期性纳米结构基底上来实现的，该基底在各种入射角下照射。超分辨率是由于高空间频率的场照明的样品和使用的反演算法重建的相对介电常数从衍射远场的地图。因此，我们能够获得近场分辨率的宽场图像，而无需扫描样品附近的探针。
We propose an optical imaging system, in which both illumination and collection are done in far field, that presents a power of resolution better than one-tenth of the wavelength. This is achieved by depositing the sample on a periodically nanostructured substrate illuminated under various angles of incidence. The superresolution is due to the high spatial frequencies of the field illuminating the sample and to the use of an inversion algorithm for reconstructing the map of relative permittivity from the diffracted far field. Thus, we are able to obtain wide-field images with near-field resolution without scanning a probe in the vicinity of the sample.