Stability of aqueous films between bubbles. Part 2. Effects of trace impurities and evaporation.
Stability of aqueous films between bubbles. Part 2. Effects of trace impurities and evaporation.
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气泡之间的水膜的稳定性。第2部分。痕量杂质和蒸发的影响。
DOI：
10.1021/la904482n
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发表时间：
2010-06-01
期刊：
影响因子：
--
通讯作者：
Horn RG
中科院分区：
文献类型：
--
作者：
Yaminsky VV;Ohnishi S;Vogler EA;Horn RG
用Mysel-Scheludko膜天平研究了水膜的稳定性。水中微量杂质对水膜在饱和蒸气条件下的寿命没有影响，但对其在自由蒸发条件下的稳定性有显著影响。微量的正吸附污染物会诱导Marangoni驱动的流动，从而在蒸发条件下破坏膜的稳定性，而负吸附的电解液实际上通过逆转界面张力梯度和驱动膜内的稳定循环来延长稳定性。在较高的减薄速率下，由于流体动力和界面张力梯度吸附应力之间的强烈耦合，纯水薄膜会发展出奇异的流动模式并破裂。蒸发条件下动态条件下的瞬时膜稳定的最主要因素是在膜中产生的表面张力梯度。我们讨论了由温差、杂质浓度和薄膜膨胀引起的暂态薄膜中的表面张力梯度。
The stability of water films has been investigated with a Mysels-Scheludko type film balance. Minor trace impurities in water do not affect the lifetime of water films under vapor saturation, but significantly influence the stability in free evaporation. Trace amounts of positively adsorbed contaminants induce Marangoni-driven flow that destabilizes films under evaporation conditions whereas negatively-adsorbed electrolytes actually prolong stability by reversing interfacial tension gradients and driving a steady circulation within the film. At high thinning rates, pure-water films develop exotic-appearing flow patterns and break due to a strong coupling between hydrodynamic and interfacial tension-gradient adsorption stresses. The most dominant factor of transient film stabilization in dynamic conditions under evaporation is a surface tension gradient created in the film. We discuss surface tension gradients in transient films created by temperature differences, impurity concentration, and expansion of the films.
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影响因子：
3.9
作者：
Karakashev, Stoyan I.;Nguyen, Phong T.;Nguyen, Anh V.
通讯作者：
Nguyen, Anh V.
影响因子：
4
作者：
Basu, Amar S.;Gianchandani, Yogesh B.
通讯作者：
Gianchandani, Yogesh B.
DOI：
10.1021/i160038a012
发表时间：
1971-01-01
期刊：
INDUSTRIAL & ENGINEERING CHEMISTRY FUNDAMENTALS
影响因子：
--
作者：
LESSARD, RR;ZIEMINSKI, SA
通讯作者：
ZIEMINSKI, SA
影响因子：
3.4
作者：
Connor, JN;Horn, RG
通讯作者：
Horn, RG
影响因子：
9.9
作者：
Chevaillier, J. -P.;Klaseboer, E.;Gourdon, C.
通讯作者：
Gourdon, C.