Temperature Effect on Transport, Charging, and Binding of Low-Energy Electrons Interacting with Amorphous Solid Water Films
Temperature Effect on Transport, Charging, and Binding of Low-Energy Electrons Interacting with Amorphous Solid Water Films
复制标题
温度对低能电子与非晶固体水膜相互作用的传输、充电和结合的影响
DOI：
10.1021/acs.jpcc.8b01674
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发表时间：
2018
影响因子：
3.7
通讯作者：
M. Asscher
中科院分区：
文献类型：
--
作者：
Roey Sagi;M. Akerman;S. Ramakrishnan;M. Asscher
颗粒上生长的固体分子膜的充电是在星际空间发生的天体化学过程中观察到的重要现象，并且与高空环境物理和化学有关。在这项工作中，我们提出的温度依赖性的电导率和电容的非晶固体水（ASW）膜（数百单层厚）沉积在Ru（0001）衬底的研究。这些层随后在超高真空（UHV）条件下在50-120 K的温度范围内与低能电子（5 eV）相互作用。ASW膜的充电通过接触电位差（CPD）检测利用原位开尔文探针测量，并发现是敏感的衬底温度在薄膜生长过程中，在电子辐照过程中的衬底温度，和膜的厚度。开发了超过108 V/m的内部电场。结果表明，固体水具有薄膜热记忆性，能传导和储存电子。
The charging of solid molecular films grown on grains is an important phenomenon observed in astrochemical processes that take place in interstellar space and is relevant in high altitude environmental physics and chemistry. In this work, we present the temperature dependence study of both the conductivity and the capacitance of amorphous solid water (ASW) films (hundreds of monolayers thick) deposited on a Ru(0001) substrate. These layers subsequently interact with low-energy electrons (5 eV) in the temperature range of 50–120 K under ultra high vacuum (UHV) conditions. The charging of the ASW films was measured via contact potential difference (CPD) detection utilizing an in situ Kelvin probe and found to be sensitive to the substrate temperature during film growth, to the substrate temperature during electron irradiation, and to the film thickness. Internal electric fields exceeding 108 V/m are developed. It is shown that solid water conducts and stores electrons with “memory” of the film’s thermal his...