Micro-PIXE (particle-induced X-ray emission analysis) applications in minerals research
Micro-PIXE (particle-induced X-ray emission analysis) applications in minerals research
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Micro-PIXE（粒子诱导 X 射线发射分析）在矿物研究中的应用
DOI：
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发表时间：
1991
期刊：
影响因子：
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通讯作者：
G. Suter
中科院分区：
文献类型：
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作者：
S. Sie;C. Ryan;G. Suter
在越来越多的案例中，利用微束质子作为非破坏性的原位探针用于地学中的痕量元素分析，证明了PIXE方法的多功能性。虽然在大多数应用中，该方法可以被认为是电子微探针方法学的派生或扩展，但质子微探针的独特特征使新的方法能够解决迄今难以解决的分析问题。S在火成岩矿物学和岩石学中建立了适当的生态位，在基础地球科学和矿产工业应用，特别是在钻石勘探行业中，具有重要的意义。本文综述了微型PIXE的最新进展，并从其他相互竞争和互补的方法出发，讨论了目前微型PIXE在地球科学中应用的优势和模拟。
The versatility of the PIXE method with microbeams of protons as a non-destructive, in-situ probe for trace element analysis in the geosciences has been demonstrated in an ever increasing number of cases. While in most applications the method can be considered as derivative or as an extension of electron microprobe methodology, features unique to the proton microprobe enable new approaches to hitherto intractable problems of analysis. An appropriate niche ha s been established in igneous mineralogy and petrology, with important impli ca tion s both in the basic geosciences as well as mineral industry applications, particularly in the diamond exploration industry. This paper reviews recent advances and discu sses the advantages and 1 imitations of current micro -PIXE applications in the geosciences in view of other competing and complimentary methods.