Microbeam Analysis of Irradiated Materials: Practical Aspects
Microbeam Analysis of Irradiated Materials: Practical Aspects
复制标题
辐照材料的微束分析：实用方面
DOI：
10.1017/s143192760707033x
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发表时间：
2007
影响因子：
2.8
通讯作者：
I. Roure
中科院分区：
文献类型：
--
作者：
J. Lamontagne;T. Blay;I. Roure
在微量分析技术中，电子探针微量分析（EPMA）是最强大的技术之一。其性能可用于提供准确的表征。在本文中，重点介绍了高辐照材料的 EPMA 与标准 EPMA 之间的差异。它侧重于屏蔽 EPMA 特性。然后，文章介绍了样品制备和分析过程中遇到的困难（主要是由于放射性背景）。尽管存在这些困难，屏蔽 EPMA 仍可以针对核辐照燃料的堆内行为提供一些有价值的结果。介绍了 EPMA 在核燃料研究中具体实例分析的一些结果。
Among the microanalytical techniques, electron probe microanalysis (EPMA) is one of the most powerful. Its performances can be used to provide an accurate characterization. In the present article the differences between the EPMA of highly irradiated materials and standard EPMA are highlighted. It focuses on the shielded EPMA specificities. Then, the article presents the difficulties encountered during the sample preparation and the analysis (mainly due to the radioactive background). In spite of these difficulties, some valuable results can be provided by a shielded EPMA on the in-pile behavior of nuclear irradiated fuel. Some results of specific examples analyzed by EPMA in nuclear fuel research are presented.