Quantitative differential interference contrast microscopy based on structured-aperture interference
Quantitative differential interference contrast microscopy based on structured-aperture interference
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DOI：
10.1063/1.2977870
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发表时间：
2008-09-01
影响因子：
4
通讯作者：
Yang, Changhuei
中科院分区：
文献类型：
--
作者：
Cui, Xiquan;Lew, Matthew;Yang, Changhuei
我们报告了一种基于结构孔径（SA）波前传感器的定量微分干涉（DIC）显微镜。与传统的DIC显微镜不同，SA-DIC显微镜可以分离图像波前的振幅和相位梯度信息，形成具有良好分辨率的样品的定量强度和DIC图像；我们的原型实现了类似于 2 μm 的分辨率。此外，由于显微镜的非偏振性质，我们能够对双折射样品进行成像而不会出现伪影。 (c) 2008 年美国物理研究所。
We report a quantitative differential interference contrast (DIC) microscope based on a structured-aperture (SA) wavefront sensor. Unlike a conventional DIC microscope, the SA-DIC microscope can separate the amplitude and the phase gradient information of the image wavefront, and form quantitative intensity and DIC images of the sample with good resolution; our prototype achieved resolution similar to 2 mu m. Furthermore, due to the nonpolarization nature of the microscope, we were able to image birefringent samples without artifacts. (c) 2008 American Institute of Physics.