Atomic force microscopy-based single-molecule force spectroscopy detects DNA base mismatches

Atomic force microscopy-based single-molecule force spectroscopy detects DNA base mismatches
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基于原子力显微镜的单分子力谱检测 DNA 碱基错配

DOI:
10.1039/c9nr05234h
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发表时间:
2019-10-07
期刊:
影响因子:
6.7
通讯作者:
Li, Bin
Li, Bin
中科院分区:
材料科学2区
文献类型:
--
作者:
Liu, Wenjing;Guo, Yourong;Li, Bin

文献摘要

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基于原子力显微镜的单分子力光谱学受到低通量的限制。我们引入可寻址DNA折纸来研究多目标分子。只有一个碱基对错配的6个目标dna在仅为4 pN的破裂力下明显分化。
Atomic force microscopy-based single-molecule-force spectroscopy is limited by low throughput. We introduce addressable DNA origami to study multiple target molecules. Six target DNAs that differed by only a single base-pair mismatch were clearly differentiated a rupture force of only 4 pN.