Self-Directed Localization of ZIF-8 Thin Film Formation by Conversion of ZnO Nanolayers
Self-Directed Localization of ZIF-8 Thin Film Formation by Conversion of ZnO Nanolayers
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DOI:
10.1002/adfm.201400559
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发表时间:
2014-08-13
影响因子:
19
通讯作者:
Fischer, Roland A.
中科院分区:
文献类型:
--
作者:
Khaletskaya, Kira;Turner, Stuart;Fischer, Roland A.
Control of localized metal-organic framework (MOF) thin film formation is a challenge. Zeolitic imidazolate frameworks (ZIFs) are an important sub-class of MOFs based on transition metals and imidazolate linkers. Continuous coatings of intergrown ZIF crystals require high rates of heterogeneous nucleation. In this work, substrates coated with zinc oxide layers are used, obtained by atomic layer deposition (ALD) or by magnetron sputtering, to provide the Zn2+ ions required for nucleation and localized growth of ZIF-8 films ([Zn(mim)(2)]; Hmim = 2-methylimidazolate). The obtained ZIF-8 films reveal the expected microporosity, as deduced from methanol adsorption studies using an environmentally controlled quartz crystal microbalance (QCM) and comparison with bulk ZIF-8 reference data. The concept is transferable to other MOFs, and is applied to the formation of [Al(OH)(1,4-ndc)](n) (ndc = naphtalenedicarboxylate) thin films derived from Al2O3 nanolayers.