Significant softening of copper nanowires during electromigration studied by picosecond ultrasound spectroscopy

Significant softening of copper nanowires during electromigration studied by picosecond ultrasound spectroscopy
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皮秒超声光谱研究电迁移过程中铜纳米线的显着软化

DOI:
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发表时间:
2010
期刊:
Phys.Rev.B
影响因子:
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通讯作者:
M.Hirao
M.Hirao
中科院分区:
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文献类型:
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作者:
H.Ogi;A.Yamamoto;K.Kondou;K.Nakano;K.Morita;N.Nakamura;T.Ono;M.Hirao

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