New method of the precise measurement for the thickness and bulk etch rate of the solid-state track detector
New method of the precise measurement for the thickness and bulk etch rate of the solid-state track detector
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DOI：
10.1016/j.nima.2007.01.086
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发表时间：
2007-04-21
影响因子：
1.4
通讯作者：
Ogura, K.
中科院分区：
文献类型：
--
作者：
Kodaira, S.;Yasuda, N.;Ogura, K.
本文介绍了一种用于测量CR-39径迹探测器局部厚度的新型光学系统。它可以应用于局部测量整个探测器区域的厚度，以制作体蚀刻量的地图。使用CR-39检测器，厚度测量的准确度为+/- 0.2 μ m。该精度比传统方法（例如千分尺方法）高一个数量级，并且与光学显微镜下的轨道尺寸测量相当。这也将大大提高CR-39探测器的电荷和质量分辨率，使我们可以应用于测量银河宇宙线核，特别是银河宇宙线中的反式铁核（Z ≥ 30）。(c)2007 Elsevier B. V.保留所有权利。
New optical system with an optical displacement sensor has been developed to measure the local thickness of CR-39 track detector. It can be applied to measure locally the thicknesses of whole detector area for making a map of the amount of bulk etch. The accuracy of the thicknesses measurement was found to be +/- 0.2 mu m using CR-39 detector. This accuracy is one order of magnitude higher than that of conventional methods, such as the Micrometer method, and is comparable to that of track size measurement under the optical microscope. It will also greatly improve the charge and mass resolutions of CR-39 detector that we can apply to measure galactic cosmic rays (GCRs) nuclei, especially the trans-iron nuclei (Z >= 30) in GCRs. (c) 2007 Elsevier B.V. All rights reserved.