SURFACE-PLASMON-ONE-ELECTRON DECAY AND ITS OBSERVATION IN PHOTOEMISSION
SURFACE-PLASMON-ONE-ELECTRON DECAY AND ITS OBSERVATION IN PHOTOEMISSION
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DOI：
10.1103/physrevlett.24.64
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发表时间：
1970-01-01
影响因子：
8.6
通讯作者：
SPICER, WE
中科院分区：
文献类型：
--
作者：
ENDRIZ, JG;SPICER, WE
从轻微粗糙的铝表面的光电发射测量中获得了表面等离子体衰变为单电子激发的证据。一个简单的理论已被开发，解释了所得的光产率在粗糙度辅助等离子体耦合导致的反射率的下降，以及与这些激发的等离子体相关的领域的相对穿透深度。
Evidence for the decay of surface plasmons into one-electron excitations has been obtained in photoemission measurements from a slightly roughened surface of aluminum. A simple theory has been developed which explains the resultant photoyield in terms of both the drop in reflectance resulting from roughness-aided plasmon coupling, and the relative penetration depth of the fields associated with these excited plasmons.