Effects of X-ray irradiation on the structure and field electron emission properties of vertically aligned few-layer graphene
Effects of X-ray irradiation on the structure and field electron emission properties of vertically aligned few-layer graphene
复制标题
X射线辐照对垂直取向少层石墨烯结构和场电子发射性能的影响
DOI:
10.1016/j.nimb.2013.04.041
复制
发表时间:
2013-06-01
影响因子:
1.3
通讯作者:
Chen, Jun
中科院分区:
文献类型:
--
作者:
Wu, J. Q.;Zhang, Y.;Chen, Jun
Vertically aligned few-layer graphene is prepared using microwave plasma enhanced chemical vapor deposition. The vertically aligned few-layer graphene is irradiated by X-ray of different doses from synchrotron radiation. The main structure of vertically aligned few-layer graphene is found to remain unchanged after X-ray irradiation both in high and low vacuum. X-ray photoelectron spectroscopy results reveal that the oxygen content in pristine and irradiated few-layer graphene remain unchanged after X-ray irradiation in high vacuum. When irradiated in low vacuum, the oxygen content in few-layer graphene increases with X-ray dose. For the vertically aligned few-layer graphene irradiated in low vacuum, the work function first increases and then slightly decreases with further increase irradiation dose from 9.0 x 10(14) to 3.6 x 10(15) phs/cm(2). The field electron emission turn-on field is observed to increase from 4.0 to 9.1 MV/m after X-ray irradiation with the dose of 3.6 x 10(15) phs/cm(2). The mechanism of the changes in work function and field emission performance of vertically aligned few-layer graphene after X-ray irradiation in low vacuum are discussed. (C) 2013 Elsevier B.V. All rights reserved.