Effects of X-ray irradiation on the structure and field electron emission properties of vertically aligned few-layer graphene

Effects of X-ray irradiation on the structure and field electron emission properties of vertically aligned few-layer graphene
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X射线辐照对垂直取向少层石墨烯结构和场电子发射性能的影响

DOI:
10.1016/j.nimb.2013.04.041
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发表时间:
2013-06-01
影响因子:
1.3
通讯作者:
Chen, Jun
Chen, Jun
中科院分区:
物理与天体物理4区
文献类型:
--
作者:
Wu, J. Q.;Zhang, Y.;Chen, Jun

文献摘要

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采用微波等离子体增强化学气相沉积法制备了垂直取向的石墨烯薄膜。垂直排列的几层石墨烯被来自同步辐射的不同剂量的X射线照射。在高真空和低真空中X射线辐照后,垂直排列的少层石墨烯的主要结构都保持不变。X射线光电子能谱结果表明,在高真空条件下X射线辐照后,未辐照和辐照后的少层石墨烯中的氧含量保持不变。在低真空下辐照时,少层石墨烯中的氧含量随着X射线剂量的增加而增加。对于垂直排列的几层石墨烯,在低真空中辐照后,功函数随辐照剂量从9.0×10(14)增加到3.6×10(15)pps/cm(2)先增大后略有减小。经3.6×10(15)PHS/cm(2)剂量X射线照射后,场电子发射开启场强从4.0 mV/m增加到9.1 mV/m。讨论了低真空X射线辐照后垂直排列的少层石墨烯的功函数和场发射性能变化的机理。(C)2013爱思唯尔B.V.保留所有权利。
Vertically aligned few-layer graphene is prepared using microwave plasma enhanced chemical vapor deposition. The vertically aligned few-layer graphene is irradiated by X-ray of different doses from synchrotron radiation. The main structure of vertically aligned few-layer graphene is found to remain unchanged after X-ray irradiation both in high and low vacuum. X-ray photoelectron spectroscopy results reveal that the oxygen content in pristine and irradiated few-layer graphene remain unchanged after X-ray irradiation in high vacuum. When irradiated in low vacuum, the oxygen content in few-layer graphene increases with X-ray dose. For the vertically aligned few-layer graphene irradiated in low vacuum, the work function first increases and then slightly decreases with further increase irradiation dose from 9.0 x 10(14) to 3.6 x 10(15) phs/cm(2). The field electron emission turn-on field is observed to increase from 4.0 to 9.1 MV/m after X-ray irradiation with the dose of 3.6 x 10(15) phs/cm(2). The mechanism of the changes in work function and field emission performance of vertically aligned few-layer graphene after X-ray irradiation in low vacuum are discussed. (C) 2013 Elsevier B.V. All rights reserved.