Feature-based characterisation of surface topography and its application
Feature-based characterisation of surface topography and its application
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DOI：
10.1016/j.cirp.2021.05.001
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发表时间：
2021-08-31
影响因子：
4.1
通讯作者：
Blateyron, Francois
中科院分区：
文献类型：
--
作者：
Jiang, Xiangqian;Senin, Nicola;Blateyron, Francois
本主题论文概述了基于特征的表征新兴技术，适用于具有特征的表面形貌。它是对使用纹理场参数的传统表面表征的补充。提出了特征谱的原始概念来组织表面，以帮助为不同类型的表面形貌选择适当的表征，并在表征、制造工艺和表面功能之间实现更直接的关系。主题论文重点介绍基于特征的表征技术的基础知识和最新技术。阐述并讨论了基于特征的表征的应用。制定了未来工业应用的指南，并解决了对未来挑战的考虑。表面、微观结构、基于特征的表征。 (c) 2021 年作者。由 Elsevier Ltd 代表 CIRP 发布。这是一篇基于 CC BY 许可证的开放获取文章 (http://creativecommons.org/licenses/by/4.0/)
This keynote paper gives an overview of emerging technologies of feature-based characterisation, for surface topographies having features. It is complementary to conventional surface characterisation using texture field parameters. An original concept, the feature spectrum is proposed to organise surfaces, in order to help select the appropriate characterisation for different types of surface topographies and to achieve a more direct relationship between characterisation, manufacturing process and surface function. The keynote paper focuses on fundamentals and the state of the art for feature-based characterisation technologies. Applications of feature-based characterisation are illustrated and discussed. Guidelines for future industrial applications are laid out, and considerations for future challenges are addressed. Surfaces, Micro structure, Feature-based Characterisation. (c) 2021 The Authors. Published by Elsevier Ltd on behalf of CIRP. This is an open access article under the CC BY license (http://creativecommons.org/licenses/by/4.0/)