The thickness dependence of the magnetic domain structure in cobalt monocrystals studied by SEM
The thickness dependence of the magnetic domain structure in cobalt monocrystals studied by SEM
复制标题
SEM 研究钴单晶磁畴结构的厚度依赖性
DOI：
10.1016/0304-8853(95)00492-0
复制
发表时间：
1996
影响因子：
2.7
通讯作者：
W. Szmaja
中科院分区：
文献类型：
--
作者：
W. Szmaja
用扫描电子显微镜（SEM）中的I型磁衬度观察了钴单晶基面上的磁畴结构。对厚度从1.9 mm到10 μm的一系列钴单晶进行了磁畴结构厚度依赖性的研究。由于使用的厚度较小的磁畴成像的问题，以及厚晶体中的磁畴结构的复杂特性，数字图像处理应用于原始SEM图像的恢复，增强和分析。本文对钴单晶中第一类磁衬度的分辨极限进行了估计，并计算了磁畴宽度的统计分布。
The type-I magnetic contrast in a scanning electron microscope (SEM) was used to observe the magnetic domain structure on the basal planes of cobalt monocrystals. The study of the thickness dependence of the domain structure was carried out on a series of cobalt single crystals in the thickness range 1.9 mm down to 10 μm. Because of the problems in imaging magnetic domains for the smaller thicknesses used, and the complex character of the domain structure in thick crystals, digital image processing was applied to the original SEM images for their restoration, enhancement and analysis. The limit of resolution of type-I magnetic contrast in cobalt monocrystals has been evaluated, and the statistical distributions of the magnetic domain widths have been calculated.