High-energy performance of x-ray imaging spectrometers on board Astro-E
High-energy performance of x-ray imaging spectrometers on board Astro-E
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Astro-E 上 X 射线成像光谱仪的高能性能
DOI：
10.1117/12.391549
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发表时间：
2000
期刊：
影响因子：
--
通讯作者：
K. Koyama
中科院分区：
文献类型：
--
作者：
K. Imanishi;H. Awaki;T. Tsuru;K. Hamaguchi;H. Murakami;M. Nishiuchi;K. Koyama
本文详细研究了X射线CCD相机（XIS； X射线成像光谱仪）的响应函数。单色x射线的脉冲高度分布显示出一个低能量的尾分量和除了与入射x射线能量相对应的主峰外的几条弱谱线。我们将响应函数分为六个部分；主峰、次峰、三角分量、常数分量、Si逸出、Si线。每一个都代表CCD中不同的物理过程。我们通过数据拟合、数值计算和蒙特卡罗模拟来研究这些分量的形状和强度对能量的依赖关系，并将响应函数作为x射线能量的函数。
We present the detailed study of the response function of X- ray CCD cameras (XIS; X-ray Imaging Spectrometer). A pulse height distribution for monochromatic X-rays show a low- energy tail component and several weak lines in addition to main peak corresponding to incident X-ray energy. We divided the response function into six components; main peak, sub peak, triangle component, constant component, Si escape, and Si line. Each of them represents different physical processes in the CCD. We did the data fitting, numerical calculations, and Monte Carlo simulations to study energy dependence of the shape and intensity of these components, and made the response function as a function of X-ray energy.