Enhanced Sorption of Radionuclides by Defect-Rich Graphene Oxide.
Enhanced Sorption of Radionuclides by Defect-Rich Graphene Oxide.
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DOI：
10.1021/acsami.0c11122
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发表时间：
2020-10-07
影响因子：
9.5
通讯作者：
Talyzin AV
中科院分区：
文献类型：
--
作者：
Boulanger N;Kuzenkova AS;Iakunkov A;Romanchuk AY;Trigub AL;Egorov AV;Bauters S;Amidani L;Retegan M;Kvashnina KO;Kalmykov SN;Talyzin AV
极缺陷氧化石墨烯（dGO）是一种用于放射性废物和受污染自然水体处理的高级吸附剂。以还原氧化石墨烯（rGO）为前驱体，采用改进的Hummers氧化工艺制备的氧化石墨烯对U（VI）、Am（III）和Eu（III）的吸附性明显高于标准氧化石墨烯（GOs）。早期的研究揭示了氧化石墨烯薄片缺陷对放射性核素吸附的机理。因此，利用氧化石墨的爆炸热剥落法制备了含有大量缺陷和孔洞的氧化石墨烯。悍马氧化还原氧化石墨烯还引入了缺陷和孔洞，从而提供了一种缺陷极其丰富的材料。XPS、TGA和FTIR表征分析表明，氧化石墨烯氧官能团主要与缺陷有关，如片状边缘和空穴边缘原子，而标准氧化石墨烯氧官能团主要在平面表面。与标准悍马GO相比，dGO中大量的缺陷导致U（VI）的吸附能力增加了15倍。同步辐射扩展x射线吸收精细结构（EXAFS）和高能分辨率荧光检测x射线吸收近边缘结构（HERFD-XANES）光谱分析表明，氧化石墨烯的吸附能力的提高与氧化石墨烯薄片空穴边缘原子附着丰富的羧基有关。
Extremely defect graphene oxide (dGO) is proposed as an advanced sorbent for treatment of radioactive waste and contaminated natural waters. dGO prepared using a modified Hummers oxidation procedure, starting from reduced graphene oxide (rGO) as a precursor, shows significantly higher sorption of U(VI), Am(III), and Eu(III) than standard graphene oxides (GOs). Earlier studies revealed the mechanism of radionuclide sorption related to defects in GO sheets. Therefore, explosive thermal exfoliation of graphite oxide was used to prepare rGO with a large number of defects and holes. Defects and holes are additionally introduced by Hummers oxidation of rGO, thus providing an extremely defect-rich material. Analysis of characterization by XPS, TGA, and FTIR shows that dGO oxygen functionalization is predominantly related to defects, such as flake edges and edge atoms of holes, whereas standard GO exhibits oxygen functional groups mostly on the planar surface. The high abundance of defects in dGO results in a 15-fold increase in sorption capacity of U(VI) compared to that in standard Hummers GO. The improved sorption capacity of dGO is related to abundant carboxylic group attached hole edge atoms of GO flakes as revealed by synchrotron-based extended X-ray absorption fine structure (EXAFS) and high-energy resolution fluorescence detected X-ray absorption near edge structure (HERFD-XANES) spectroscopy.
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影响因子：
4.7
作者：
通讯作者：
--
影响因子：
15
作者：
HUMMERS, WS;OFFEMAN, RE
通讯作者：
OFFEMAN, RE
影响因子：
29.4
作者：
Erickson, Kris;Erni, Rolf;Zettl, Alex
通讯作者：
Zettl, Alex
DOI：
10.1002/zaac.19653350107
发表时间：
1965-01-01
影响因子：
1.4
作者：
BOEHM, HP;SCHOLZ, W
通讯作者：
SCHOLZ, W
影响因子：
11.4
作者：
Duster, Thomas A.;Szymanowski, Jennifer E. S.;Fein, Jeremy B.
通讯作者：
Fein, Jeremy B.