Y.Jeong: "Effects of various Hydrogenation Processes on Bias-stress-Induced Degradation in in P-channel Poly TFT"Jpn.J.Appl.Phys.. 41. 5046-5064 (2002)
Y.Jeong: "Effects of various Hydrogenation Processes on Bias-stress-Induced Degradation in in P-channel Poly TFT"Jpn.J.Appl.Phys.. 41. 5046-5064 (2002)
复制标题
Y.Jeong:“各种氢化过程对 P 沟道多晶硅 TFT 中偏置应力诱导退化的影响”Jpn.J.Appl.Phys.. 41. 5046-5064 (2002)
DOI:
--
复制
发表时间:
--
期刊:
影响因子:
--
通讯作者:
中科院分区:
文献类型:
--
作者: