Room temperature piezoelectric displacement detection via a silicon field effect transistor
Room temperature piezoelectric displacement detection via a silicon field effect transistor
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DOI:
10.1063/1.3271525
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发表时间:
2009-12-07
影响因子:
4
通讯作者:
Yamaguchi, H.
中科院分区:
文献类型:
--
作者:
Mahboob, I.;Nishiguchi, K.;Yamaguchi, H.
An electromechanical oscillator embedded with a two dimensional electron gas is capacitively coupled to a silicon field effect transistor (Si-FET). The piezovoltage induced by the mechanical motion modulates the current passing through the Si-FET enabling the electromechanical oscillator's position to be monitored. When the Si-FET is biased at its optimal point, the motion induced piezovoltage can be amplified resulting in a displacement sensitivity of 6 x 10(-12) mHz(-1/2) for a 131 kHz GaAs resonator which is among the highest recorded for an all-electrical room temperature detection scheme. (C) 2009 American Institute of Physics. [doi:10.1063/1.3271525]