Fractal frontiers in microelectronic ceramic materials
Fractal frontiers in microelectronic ceramic materials
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DOI：
10.1016/j.ceramint.2019.01.020
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发表时间：
2019-05-01
影响因子：
5.2
通讯作者：
Vlahovic, Branislav
中科院分区：
文献类型：
--
作者：
Mitic, Vojislav V.;Lazovic, Goran;Vlahovic, Branislav
世界对能源和微电子小型化的长期需求带来了一系列广泛的技术和科学挑战。材料以基于分形分析的精确微结构为特征，尺寸可达纳米级，是寻找新的解决方案的重要途径。根据Heywang模型，这种类型的深层材料结构层次在容量方面开辟了新的可能性，特别是当通过分形法扩展时，以及由其分形性支持和识别的晶间关系。这些发展为微电子小型化开辟了新的领域。它们建立在早期的分形应用之上，这些应用被用作微型化研究的工具，并为各种能源技术提供了应用前景。换句话说，分形学作为现代理论实验物理和材料科学的一个重要概念，与更高的集成工艺和微电子微型化密切相关。它们还具有应对能源开发挑战的潜力。在这一研究背景下，我们首次从实验和理论上研究了颗粒间的静电场在分形性质方面的分布。它本质上是一种理论实验，它基于用扫描电子显微镜成像的实验微结构的样本，正如之前在许多其他论文中发表的那样。现在，我们通过巩固实验样本来进一步研究，关于样本质量内颗粒和气孔的预测分布。我们通过打开关于固结技术过程的尺度尺寸框架做出了原创性的贡献。这让我们可以预测微结构的组成元素--大致等距的颗粒和气孔。在本文中，我们以一种实用的方式定义了实际样品的实验固结的最终目标元素。它是设计的微结构和相关特性之间的主要桥梁--例如，下一代分形微电子的分形维和最终特性。
The world's perennial need for energy and microelectronic miniaturization brings with it a broad set of technological and scientific challenges. Materials characterized by precise microstructural architectures based on fractal analysis and ranging in size down to nano scale represent an important avenue for finding novel solutions. Deep materials structure hierarchies of this type open new possibilities in capacity according to the Heywang model, especially when extended by a fractals approach and intergranular relationships supported and recognized by their fractal nature. These developments are opening new frontiers in microelectronics miniaturization. They build on early fractal applications that were used as tools in miniaturization research and also provided application perspectives for diverse energy technologies. In other words, fractals, as a crucial concept of modem theoretical-experimental physics and materials sciences, are tightly linked to higher integration processes and microelectronics miniaturization. They also hold potential for meeting the energy exploitation challenge. In this research context, for the first time we experimentally and theoretically investigated the electrostatic field between the grains within fractal nature aspects. It is essentially a theoretical experiment based on samples of experimental microstructures imaged with SEM, as previously published in a number of other papers. We now take the research a step further by consolidating the experimental samples with respect to the predicted distribution of grains and pores within the sample mass.We make an original contribution by opening the frame of scale sizes with respect to the technical processes of consolidation. This lets us predict the constitutive elements of the microstructures - approximately equidistant grains and pores. In this paper we define in a practical manner the final target elements for experimental consolidation of real samples. It is the main bridge between a designed microstructure and related characteristics - for example, fractal dimensions and final properties of next-generation fractal microelectronics.