Topological analysis of the experimental electron density
Topological analysis of the experimental electron density
复制标题
实验电子密度的拓扑分析
DOI：
10.1139/v96-131
复制
发表时间：
1996
影响因子：
1.1
通讯作者：
V. Tsirelson
中科院分区：
文献类型：
--
作者：
V. Tsirelson
描述了从 X 射线衍射数据重建的实验电子密度的拓扑分析方法。讨论了它们的优点和缺点，并介绍了有机和无机结晶固体的结果。
Methods of topological analysis of the experimental electron density reconstructed from X-ray diffraction data are described. Their advantages and drawbacks are discussed and the results for organic and inorganic crystalline solids are presented.