Systematic Investigation of Ferroelectric Properties in x%YO1.5-(100-x%)Hf1-yZryO2 Films

Systematic Investigation of Ferroelectric Properties in x%YO1.5-(100-x%)Hf1-yZryO2 Films
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系统%20调查%20of%20铁电%20性质%20in%20x%YO1.5-(100-x%)Hf1-yZryO2%20薄膜

DOI:
10.1021/acsaelm.2c01658
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发表时间:
2023
影响因子:
4.7
通讯作者:
Funakubo Hiroshi
Funakubo Hiroshi
中科院分区:
材料科学3区
文献类型:
--
作者:
Mimura Takanori;Tashiro Yuki;Shimizu Takao;Funakubo Hiroshi

文献摘要

相似文献

采用外延%YO1.5 - (100-x %) hf1 - yzryo2薄膜研究了成分对铁电性能的影响。四方相在与正交相或单斜相的相边界附近,通过场致相变从四方相到正交相表现出铁电性。值得注意的是,通过场诱导相变产生的正交相具有较低的矫顽力场(Ec)。在1400 (5% yo1.5 ~ 95%(Hf0.50Zr0.50)O2) ~ 2400 kV/cm (5% yo1.5 ~ 95%(Hf0.75Zr0.25)O2)范围内,残余极化(Pr)值为~ 17 μC/cm2。这些结果对于具有低压驱动的铁电器件应用具有重要意义。
The effect of composition on the ferroelectric properties was investigated using epitaxialx%YO1.5–(100–x%)Hf1–yZryO2films. The tetragonal phase, with a composition near the phase boundaries with the orthorhombic or monoclinic phase, exhibits ferroelectricity through the field-induced phase transition from the tetragonal to the orthorhombic phase. Remarkably, the orthorhombic phase generated via the field-induced phase transition has a lower coercive field (Ec). TheEccould be controlled from 1400 (5%YO1.5–95%(Hf0.50Zr0.50)O2) to 2400 kV/cm (5%YO1.5–95%(Hf0.75Zr0.25)O2) with the same remnant polarization (Pr) value of ∼17 μC/cm2. These results are important for ferroelectric device applications with low-voltage drives.