Critical Phenomena at Surfaces and Interfaces: Evanescent X-Ray and Neutron Scattering
Critical Phenomena at Surfaces and Interfaces: Evanescent X-Ray and Neutron Scattering
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表面和界面的关键现象：倏逝 X 射线和中子散射
DOI：
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发表时间：
1992
期刊：
影响因子：
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通讯作者：
T. Jach
中科院分区：
文献类型：
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作者：
H. Dosch;T. Jach
由于放牧角x射线和神经元散射的新实验技术，以及表面诱导有序和无序等理论概念和预测，在理解表面和界面的关键现象方面取得了很大进展。本书讨论了固体内部的渐升x射线和中子波的散射。特别强调的是利用这种技术从表面的真实结构、埋藏界面和磁性界面以及表面粗糙度中提取微观信息。
Much progress has been made in the understanding of critical phenomena at surfaces and interfaces as a result of the novel experimental technique of grazing angle x-ray and neuron scattering, and theoretical concepts and predictions such as surface-induced order and disorder. This volume treats the scattering of evanascent x-ray and neutron waves inside a solid. Particular emphasis is put on the use of this technique to extract microscopic information from the real structure of a surface, from buried and magnetic interfaces and from surface roughness.