AN X-RAY DIFFRACTION STUDY OF HUMIC ACIDS
AN X-RAY DIFFRACTION STUDY OF HUMIC ACIDS
复制标题
腐植酸的 X 射线衍射研究
DOI:
10.1080/00380768.1984.10434664
复制
发表时间:
1984
影响因子:
2
通讯作者:
M. Shiraishi
中科院分区:
文献类型:
--
作者:
Y. Matsui;K. Kumada;M. Shiraishi
A, Rp and P type humic acids and certain related materials were subjected to X-ray diffraction analysis. In general, the soil humic acids exhibited y- and (002)-bands. A and Rp type humic acids showed (002)- and y-bands, respectively. P type humic acid exhibited y- and (002)-bands, with the former predominating with regard to the latter. The (002)-band of A type humic acids was further analyzed using the Fourier transformation method. The number of layers stacked parallel to each other was 9 on the average. The most commonly found stacking units consisted of 2 and 3 layers. The average maximum number of layers per stack was 2.66. The weight percent of stack per humic acid was up to 32. In the case of Sochicken-1 humic acid (A type) extracted from Kuroboku soil, the presence of layer stacking was confirmed by transmission electron microscopy. Based on these results, the structure of humic acids is discussed.