Substrate influence on the optical and structural properties of pulsed laser deposited BiFeO3 epitaxial films
Substrate influence on the optical and structural properties of pulsed laser deposited BiFeO3 epitaxial films
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DOI：
10.1063/1.3437059
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发表时间：
2010-06-15
影响因子：
3.2
通讯作者：
Zahn, D. R. T.
中科院分区：
文献类型：
--
作者：
Himcinschi, C.;Vrejoiu, I.;Zahn, D. R. T.
使用变角光谱椭圆光度术、真空紫外椭圆光度术、显微拉曼光谱和 X 射线衍射研究了脉冲激光沉积在 SrTiO3、Nb: 掺杂 SrTiO3 和 DyScO3 上的外延 BiFeO3 薄膜。 DyScO3 上沉积的薄膜的能带隙为2.75 eV，而Nb:掺杂SrTiO3 上沉积的薄膜的能带隙大50 meV。与沉积在 DyScO3 上的薄膜相比，沉积在 Nb: 掺杂 SrTiO3 上的 BiFeO3 薄膜的介电函数发生蓝移，表明沉积在 Nb: 掺杂 SrTiO3 上的薄膜具有更大的压缩应变。拉曼光谱和高分辨率 X 射线衍射研究证实了这一点。 (C) 2010 年美国物理研究所。 [doi:10.1063/1.3437059]
Epitaxial BiFeO3 films pulsed laser deposited on SrTiO3, Nb:doped SrTiO3, and DyScO3 were studied using variable angle spectroscopic ellipsometry, vacuum ultraviolet ellipsometry, micro-Raman spectroscopy, and x-ray diffraction. The energy band gap of the film deposited on DyScO3 is 2.75 eV, while the one for the film deposited on Nb:doped SrTiO3 is larger by 50 meV. The blueshift in the dielectric function of the BiFeO3 films deposited on Nb:doped SrTiO3 compared to the films deposited on DyScO3, indicates a larger compressive strain in the films deposited on Nb:doped SrTiO3. This is confirmed by Raman spectroscopy and by high resolution x-ray diffraction investigations. (C) 2010 American Institute of Physics. [doi:10.1063/1.3437059]