Force-feedback joystick as a low-cost haptic interface for an atomic-force-microscopy nanomanipulator
Force-feedback joystick as a low-cost haptic interface for an atomic-force-microscopy nanomanipulator
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DOI：
10.1007/s00339-002-1973-8
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发表时间：
2003-04
期刊：
影响因子：
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通讯作者：
F. Rubio-Sierra;R. Stark;S. Thalhammer;W. Heckl
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文献类型：
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作者：
F. Rubio-Sierra;R. Stark;S. Thalhammer;W. Heckl
为了在纳米尺度上操纵材料，必须开发新的方法和设备。设计并实现了商用原子力显微镜(AFM)系统中的纳米操纵器接口。在定位操纵杆的帮助下，AFM探头以纳米精度直接定位成为可能。商业化的力反馈操纵杆作为触觉界面，为用户提供了提示-样本交互的实时感觉。由于开放式设计，操纵器接口可以与SPM系列的其他显微镜一起使用。此外，在倒置光学显微镜上将纳米操纵器与用于光烧蚀的紫外光激光微束相结合。为了测试这种纳米操纵器，我们用光解和机械AFM操作两种方法解剖了人类中期染色体。实验结果表明，将这两种方法相结合，可以在一台综合仪器上对不同尺度的生物材料进行操作。用原子力显微镜详细研究了操作对染色体的影响。通过光子烧蚀实现了400 nm以下的切割。可以分离出小于500纳米的染色体片段。通过机械显微切割，通过施加不同的载荷，可以很容易地获得从80 nm到500 nm的不同尺寸的切割。
In order to manipulate materials at the nanometer scale, new methods and devices have to be developed. A nanomanipulator interface was designed and implemented in a commercial atomic-force-microscope (AFM) system. With the aid of a positioning joystick, direct positioning of the AFM probe with nanometer precision was possible. A commercial force-feedback joystick served as a haptic interface and provided the user with real-time feeling of the tip–sample interactions. Due to the open design, the manipulator interface could be used with other microscopes of the SPM family. In addition, the nanomanipulator and an UV-laser microbeam for photoablation were combined on an inverted optical microscope. To test the nanomanipulator, human metaphase chromosomes were dissected using both photoablation and mechanical AFM manipulation. The experimental results show that by combining both methods, biological material can be manipulated on different size scales in one integrated instrument. The effects of manipulation on the chromosome were studied in detail by AFM. Sub-400 nm cuts were achieved by photonic ablation. Chromosomal fragments of a size less than of 500 nm could be isolated. By means of mechanical microdissection, different cut sizes ranging from 80 nm to 500 nm could be easily obtained by applying different load forces.