A comparison of space-charge distributions in electron-beam irradiated FEP obtained by using heat-wave and pressure-pulse techniques
A comparison of space-charge distributions in electron-beam irradiated FEP obtained by using heat-wave and pressure-pulse techniques
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DOI：
10.1088/0022-3727/30/11/016
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发表时间：
1997-06
期刊：
影响因子：
--
通讯作者：
P. Bloss;M. Steffen;H. Schafer;G. Yang;G. Sessler
中科院分区：
文献类型：
--
作者：
P. Bloss;M. Steffen;H. Schafer;G. Yang;G. Sessler
本文报道了用热波（LIMM）和压力脉冲（LIPP）测量电子束辐照聚四氟乙烯FEP（厚）中的空间电荷分布。在整个样品厚度上比较了两种方法得到的空间电荷分布。从具有后表面散热片的LIMM中，可以发现从照明表面到至少一半样品厚度的空间电荷分布。对于体空间电荷的位置，热波和LIPP的响应结果基本一致。利用LIMM方法，在金属化样品表面进行电子束辐照时，发现在表面附近有一个额外的负电荷层。
In the present paper, heat wave (LIMM) and pressure pulse (LIPP) measurements of the space-charge distributions in electron-beam irradiated Teflon FEP ( thick) are reported. The space-charge profiles obtained by the two methods are compared over the whole sample thickness. From the LIMM with the back surface heat sink, the space-charge distribution can be found from the surface of illumination up to at least half of the sample thickness. For the position of the bulk space charge, the heat wave and LIPP response results agree with each other to within . By using LIMM, an additional negative charge layer near the surface is found if the electron-beam irradiation is carried out through the metallized sample surface.