X pinch as a source for X-ray radiography
X pinch as a source for X-ray radiography
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X 捏作为 X 射线照相源
DOI：
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发表时间：
2001
期刊：
影响因子：
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通讯作者：
S. Lebedev
中科院分区：
文献类型：
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作者：
S. Pikuz;T. Shelkovenko;V. Romanova;D. Sinars;D. Hammer;S. Bland;S. Lebedev
最近的实验[2，6，7，13-16]表明，高密度等离子体的X射线照相术是研究爆炸丝或内爆丝阵列的有效诊断方法。设计了两种射线照相方法，单色和直接点投影X射线照相，并用于研究表1所列脉冲功率发生器上的线或线阵列爆炸。对于点投影（即，无针孔）X射线照相术中，X射线源的尺寸和持续时间很重要，因为它们直接决定了成像系统的空间和时间分辨率。在这篇文章中，我们描述的亮点（强X射线发射区）形成的最简单的图1a中描述的X箍缩这些参数的测量，并讨论了两个背光技术使用X箍缩X射线源的性能。
Recent experiments [2, 6, 7, 13–16] have shown that Xray radiography of high density plasmas is an effective diagnostic method for studying exploding wires or imploding wire arrays. Two methods of radiography, monochromatic and direct point projection X-ray radiography, were designed and used to investigate wire or wire array explosions on the pulsed power generators listed in Table 1. For point projection (i.e., no pinhole) X-ray radiography the size and duration of the X-ray source are important, because they directly determine the spatial and temporal resolution of the imaging system. In this article we describe measurements of these parameters for the bright spots (intense X-ray emission regions) formed in the X pinch depicted most simply in Fig. 1a, and discuss the performance of two backlighting techniques using X pinch X-ray sources.