Separation of Orientational Disorder in the X-Ray Analysis of the Kinetically Stabilized 2-Silanaphthalene
Separation of Orientational Disorder in the X-Ray Analysis of the Kinetically Stabilized 2-Silanaphthalene
复制标题
动力学稳定 2-硅萘的 X 射线分析中取向无序的分离
DOI：
10.1246/bcsj.73.2157
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发表时间：
2000
影响因子：
4
通讯作者：
R. Okazaki
中科院分区：
文献类型：
--
作者：
K. Wakita;N. Tokitoh;R. Okazaki
通过分离重叠的两个2-硅萘基团的无序性，使稳定的2-硅萘的晶体结构得到了更充分的细化。2-硅萘环的键长与我们先前报道的理论计算值吻合较好。
The crystal structure of the stable 2-silanaphthalene was refined more adequately by the separation of the disorder of overlapped two 2-silanaphthalene moieties. The bond lengths of the 2-silanaphthalene ring were in fairly good agreement with the theoretically calculated values which we previously reported.