Electron ionization and excitation coefficients for argon, krypton, and xenon in the low E/N region
Electron ionization and excitation coefficients for argon, krypton, and xenon in the low E/N region
复制标题
低 E/N 区域中氩、氪和氙的电子电离和激发系数
DOI：
--
复制
发表时间：
1980
期刊：
影响因子：
--
通讯作者：
T. Detemple
中科院分区：
文献类型：
--
作者：
L. T. Specht;S. Lawton;T. Detemple
在低E/N区域[（0.5-4）×10−16 V cm2]用漂移管装置测量了Ar、Kr和Xe的电子电离系数。在低场值时，发现电离系数异常大，这一事实归因于辐射亚稳态的表面光电子发射。这一贡献也解释了早期的测量和最近基于输运方程的计算之间的差异。根据对电离率的两个贡献和输运方程的计算，对测量结果进行了分析，得出了一组修订后的非弹性截面，这些截面与先前的截面不同，主要在于包含了形状共振。
The electron ionization coefficients for Ar, Kr, and Xe have been measured in the low E/N region [(0.5–4) ×10−16 V cm2] using a drift‐tube apparatus. At low field values, the ionization coefficient was found to be anomalously large, a fact attributed to surface photoelectron emission from radiating metastables. This contribution also explains the discrepancy between earlier measurements and recent calculations based on the transport equation. The measurements were analyzed on the basis of two contributions to the ionization rate and calculations of the transport equation, yielding a revised set of inelastic cross sections which differ from earlier ones primarily in the inclusion of shape resonances.