Production of quasimonochromatic X-ray microbeams using MeV-protons and a polycapillary X-ray half lens
Production of quasimonochromatic X-ray microbeams using MeV-protons and a polycapillary X-ray half lens
复制标题
使用 MeV 质子和多毛细管 X 射线半透镜产生准单色 X 射线微束
DOI：
10.1142/s0129083513400019
复制
发表时间：
2013
期刊：
影响因子：
--
通讯作者：
J. Hasegawa
中科院分区：
文献类型：
--
作者：
K. Ploykrachang;H. Fukuda;K. Kondo;Y. Oguri;J. Hasegawa
在本文中，我们提出了单色X射线微束，产生的质子诱导X射线技术和多毛细管X射线半透镜，作为一种工具，用于微X射线荧光（XRF）分析。用2.5 MeV质子束辐照30μm厚的平面Cu靶，产生8.0 keV的Cu Kα X射线，用多毛细管X射线半透镜聚焦Cu靶后的X射线。聚焦X射线束的焦斑尺寸为250μm，半峰全宽，使用刀口扫描方法进行了验证。光学器件的输出焦距和焦深分别测量为47 mm和1 mm。一个正方形的网格图案的Co薄膜，形成在厚的Cu基板上的热蒸发，被用作测试样品的分析性能的评价的微XRF设置。成功地实现了Co在Cu衬底上的二维分布映射，空间分辨率与束斑尺寸一致。对于该Co层，实现了2.3 ng的最小检测限。
In this paper, we have proposed monochromatic X-ray microbeams, produced by a proton-induced X-ray technique and a polycapillary X-ray half lens, as a tool for micro-X-ray fluorescence (XRF) analysis. A 30μm thick planar Cu target was irradiated by a 2.5 MeV proton beam to produce Cu KαX-rays (8.0 keV), and a polycapillary X-ray half lens was utilized to focus the X-rays emitted behind the Cu target. The focal spot size of the focused X-ray beam was 250μm at full width at half maximum, which was verified using a knife-edge scanning method. The output focal distance and the depth of focus of the optics were measured to be 47 mm and 1 mm, respectively. A square grid pattern of Co thin films, formed on a thick Cu substrate by thermal evaporation, was used as a test sample for evaluation of the analytical performance of the micro-XRF setup. Two-dimensional mapping of the Co distribution on the Cu substrate was successful, and the spatial resolution was consistent with the beam spot size. For this Co layer, a minimum detection limit of 2.3 ng was achieved.