ICCAD-2012 CAD contest in fuzzy pattern matching for physical verification and benchmark suite
ICCAD-2012 CAD contest in fuzzy pattern matching for physical verification and benchmark suite
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DOI：
10.1145/2429384.2429457
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发表时间：
2012-11
期刊：
影响因子：
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通讯作者：
J. Andres Torres
中科院分区：
文献类型：
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作者：
J. Andres Torres
随着面向制造的设计技术和设计与工艺协同优化的广泛采用，以及制造集成电路的工艺的复杂性的增加，迫切需要找到快速、准确和高性能的方法来识别可能导致成品率损失的布图拓扑。尽管完全基于的模拟提供了尽可能最准确的预测，但它们的运行时禁止在设计流程的所有级别采用。替代的传统规则检查，包括模式匹配技术，速度很快，但在寻找不属于训练集的位置方面应用有限。已经提出了几种方法来提高预测的精度，以减少遗漏结构和错误检测的数量，但没有一种方法在精度和运行时间之间达成可接受的折衷。这项竞赛的目的是提供一套布局，突出这一应用程序的挑战：广泛的不同类别，有限的数据量和低预测率。
With the widespread adoption of design for manufacturing techniques and design and process co-optimization as well as the increase in the complexity of the processes to manufacture integrated circuits there is pressing need in finding quickly to calibrate yet accurate and high performing methods to identify layout topologies which may cause yield loss. While full-based simulations provide the most accurate prediction possible their runtime prohibits an adoption at all levels of the design flow. Alternative traditional rule checking including pattern matching techniques are fast but have a limited application in finding locations that were not part the training set. Several approaches to improve the accuracy of the prediction to reduce the number of miss structures and false detections have been proposed, but none have yielded and acceptable tradeoff between accuracy and runtime. This contest is aimed to provide a suite of layouts which highlight the challenges of this application: Widely different classes, limited amount of data and low prediction rates.