Microwave Reflectometry for Plasma Density Profile Measurements on HL-2A Tokamak
Microwave Reflectometry for Plasma Density Profile Measurements on HL-2A Tokamak
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DOI：
10.1088/1009-0630/8/2/02
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发表时间：
2006-03
影响因子：
1.7
通讯作者：
Xiao Wei-wen;Liu Zetian;Ding Xuan-tong;Shi Zhongbing;V. Zhuravlev
中科院分区：
文献类型：
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作者：
Xiao Wei-wen;Liu Zetian;Ding Xuan-tong;Shi Zhongbing;V. Zhuravlev
在HL-2A装置上研制成功了调制微波反射计，可用于时延法测量等离子体密度分布。该微波反射计具有两个频率范围（26.5至40 GHz和40至60 GHz），适用于测量0.8 × 1013 cm−3至4.5 × 1013 cm−3范围内的等离子体密度。时间分辨率为1 ms，空间分辨率约为1 cm。本文介绍了微波反射计的基本原理、装置的参数标定以及在HL-2A装置上的实验结果。
A modulated microwave reflectometry has been successfully developed on HL-2A, which can be used to measure the plasma density profile with time-delay method. This microwave reflectometry has two frequency ranges (26.5 to 40 GHz and 40 to 60 GHz) and it is suitable for measuring the plasma density ranging from 0.8 × 1013 cm−3 to 4.5 × 1013 cm−3. The temporal resolution is 1 ms and the spatial resolution is about 1 cm. This paper will present the basic principle of the microwave reflectometry, parameters calibration of the equipment and the experimental results on HL-2A tokamak.