Surgical and hardware complications in subthalamic nucleus deep brain stimulation
Surgical and hardware complications in subthalamic nucleus deep brain stimulation
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DOI：
10.1016/j.jocn.2006.02.016
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发表时间：
2007-07-01
影响因子：
2
通讯作者：
Chen, Shin-Yuan
中科院分区：
文献类型：
--
作者：
Chou, Yu-Cheng;Lin, Shinn-Zong;Chen, Shin-Yuan
目标。目的：对26例运动障碍患者实施丘脑深部电刺激(STN-DBS)早期手术及硬件并发症进行分析。A组为无微电极记录(MER)的前8例患者，共进行16次颅脑手术，植入8块电池。结果A组颅内并发症发生率为18.75%，B组为5.71%；颅外并发症A组为37.5%，B组为16.67%。总死亡率为7.69%，死亡与手术无关。结论：STN-DBS相关发病率显著。MER的应用可改善临床转归，同时降低并发症。(C)2006爱思唯尔有限公司。保留所有权利。
Objective. To assess the surgical and hardware complications in 26 consecutive patients with movement disorders undergoing subthalamic deep brain stimulation (STN-DBS) in early practice at our institute.Methods: The 26 patients in our institute were analyzed retrospectively. Group A included the first eight patients treated while we had no facility for microelectrode recording (MER), 16 intracranial procedures were performed and 8 batteries were implanted. Group B (with MER) included 18 patients, 35 intracranial procedures were performed and IS batteries were implanted.Results, The intracranial morbidity was 18.75% in group A and 5.71% in group B. The extracranial morbidity was 37.5% in group A and 16.67% in group B. There was no hardware-related infection in our study. The overall mortality rate was 7.69%, and deaths were not surgical related.Conclusions: The associated morbidity is significant in STN-DBS. The use of MER may improve the clinical outcome while decreasing the morbidity. (c) 2006 Elsevier Ltd. All rights reserved.