State II Dissociation element formation following Activator excision in maize
State II Dissociation element formation following Activator excision in maize
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DOI：
10.1534/genetics.107.075770
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发表时间：
2007-10-01
期刊：
影响因子：
3.3
通讯作者：
Brutnell, Thomas P.
中科院分区：
文献类型：
--
作者：
Conrad, Liza J.;Bai, Ling;Brutnell, Thomas P.
活性激活子（Ac）元件经历突变以低频率变成非自主解离（Ds）元件。为了了解Ds形成的机制，我们已经开发了高通量遗传和分子筛选，以确定这些罕见的Ds衍生物产生的任何Ac插入在玉米基因组中。使用这些方法，我们已经确定了15个新的Ds元件来自Ac插入在8个不同的位点。大约一半的Ds元件含有插入在缺失连接处的填充物DNA，其来源于Ac内或附近的序列。与以前的报道相反，这些Ds元件中的几个缺少在供体Ac中的缺失连接和填充DNA侧翼的直接重复。为了适应我们的研究结果和其他人，我们提出了一个模型的错误倾向修复合成过程中的滑动错配来解释形成的状态II Ds元素在玉米。我们讨论了使用这些线和分子技术在这里开发的双组分Ac/Ds标记程序在玉米中捕获体细胞Ds转座事件。
Active Activator (Ac) elements undergo mutations to become nonautonomous Dissociation (Ds) elements at a low frequency. To understand the mechanism of Ds formation, we have developed high-throughput genetic and molecular screens to identify these rare Ds derivatives generated from any Ac insertion in the maize genome. Using these methods we have identified 15 new Ds elements derived from Ac insertions at eight different loci. Approximately half of the Ds elements contain filler DNA inserted at the deletion junction that is derived from sequences within or adjacent to Ac. In contrast to previous reports, several of these Ds elements lack direct repeats flanking the deletion junctions and filler DNA in the donor Ac. To accommodate our findings and those of others, we propose a model of slip mispairing during error-prone repair synthesis to explain the formation of state II Ds elements in maize. We discuss the use of these lines and molecular techniques developed here to capture somatic Ds transposition events in two-component Ac/Ds tagging programs in maize.