Heteroepitaxial growth of the intrinsic vacancy semiconductor Al2Se3 on Si(111):: Initial structure and morphology
Heteroepitaxial growth of the intrinsic vacancy semiconductor Al2Se3 on Si(111):: Initial structure and morphology
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DOI:
10.1103/physrevb.78.075321
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发表时间:
2008-08-01
影响因子:
3.7
通讯作者:
Ohuchi, Fumio S.
中科院分区:
文献类型:
--
作者:
Lu, Chih-Yuan;Adams, Jonathan A.;Ohuchi, Fumio S.
The evolution of nanostructure morphology and local chemical environment during heteroepitaxial growth of aluminum selenide on Si(I H) was investigated with scanning tunneling microscopy and high-resolution photoemission spectroscopy. Despite the strong similarity to GaSe in atomic and electronic structure during deposition of the first AlSe bilayer, subsequent growth is quite different-resulting in an alternating Al-Se-Al-Se stacking sequence consistent with defected-wurtzite-structure Al(2)Se(3). The first bilayer is completed on a given terrace before the second layer nucleates, but subsequent layers nucleate before completion of the second layer. The surfaces of well-formed Al(x)Se(y) islands are smooth and terminated by Se atoms; Al then sticks before additional Se, resulting in rougher in complete islands with Al-rich disordered surfaces. Growth with extra Al in the incident flux does not result in layered AlSe and induces only subtle differences in film morphology.