GREVE: Genomic Recurrent Event ViEwer to assist the identification of patterns across individual cancer samples
GREVE: Genomic Recurrent Event ViEwer to assist the identification of patterns across individual cancer samples
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DOI：
10.1093/bioinformatics/bts547
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发表时间：
2012-11-15
期刊：
影响因子：
5.8
通讯作者：
Broxholme, John
中科院分区：
文献类型：
--
作者：
Cazier, Jean-Baptiste;Holmes, Chris C.;Broxholme, John
GREVE 的开发是为了帮助识别癌症样本中反复出现的基因组畸变。尽管从 SNParray 到下一代测序的数据量不断增加，但此类畸变的准确表征仍然是一个挑战。此外，癌症中的基因组畸变尤其难以处理，因为它们本质上是患者所独有的。然而，它们在基因组特定区域的复发已被证明反映了它们与肿瘤发展的相关性。 GREVE 利用先前描述的事件来识别这些区域并集中进行进一步的分析。
GREVE has been developed to assist with the identification of recurrent genomic aberrations across cancer samples. The exact characterization of such aberrations remains a challenge despite the availability of increasing amount of data, from SNParray to next-generation sequencing. Furthermore, genomic aberrations in cancer are especially difficult to handle because they are, by nature, unique to the patients. However, their recurrence in specific regions of the genome has been shown to reflect their relevance in the development of tumors. GREVE makes use of previously characterized events to identify such regions and focus any further analysis.