Comparison of properties of silver-tin oxide electrical contact materials through different processing routes
Comparison of properties of silver-tin oxide electrical contact materials through different processing routes
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DOI：
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发表时间：
2008-06
影响因子：
0.9
通讯作者：
Asmita Pandey;P. Verma;O. Pandey
中科院分区：
文献类型：
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作者：
Asmita Pandey;P. Verma;O. Pandey
本文采用不同的工艺制备了银氧化锡（Ag-SnO 2）电接触材料，粉末冶金（P/M）、内氧化（I/O）和合金粉末内氧化（IOAP）。比较了制备工艺对Ag-SnO 2复合材料的导电性、致密度和显微结构等物理性能的影响。显微结构研究表明，内氧化（I/O）技术提供了最均匀的结构。
In the present work silver-tin oxide (Ag-SnO 2 ) electrical contact materials have been prepared by different processing techniques, viz., powder metallurgy (P/M), internal oxidation (I/O) and internal oxidation of alloyed powders (IOAP). The influence of processing routes on the physical properties such as electrical conductivity, density and microstructure of these Ag-SnO 2 composite materials are compared. The microstructural study reveals that internal oxidation (I/O) technique provides most uniform structure.