Structural components of the Pt/ Si(111)-(√3 X √3) surface from scanning tunneling microscopy
Structural components of the Pt/ Si(111)-(√3 X √3) surface from scanning tunneling microscopy
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扫描隧道显微镜观察到的 Pt/ Si(111)-(â3 X â3) 表面的结构成分
DOI：
10.1103/physrevb.82.075431
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发表时间：
2010
影响因子：
3.7
通讯作者：
R. Claessen
中科院分区：
文献类型：
--
作者：
P. Höpfner;M. Wisniewski;F. Sandrock;J. Schäfer;R. Claessen
利用扫描隧道显微镜对其表面进行形貌检测，确定了关键的结构元素。观察到每个单元胞中都有一个典型的三角形结构块，由大约在体Pt-Pt距离键处的电荷最大值组成。三聚体的取向与Si（111）衬底对称不相容，这在畴壁边界处表现得尤为明显。因此，一个简单的顶层三聚体模型是不够的。相反，旋转三聚体的发现指向了更复杂的表面重排，这产生了观察到的对称性破坏结构松弛，从而导致手性表面。
From topographic inspection of thesurface by scanning tunneling microscopy, key structural elements are identified. A characteristic triangular building block in eachunit cell, composed of charge maxima at approximately the bulk Pt-Pt distance bond, is observed. The orientation of the trimers is incompatible with the Si(111) substrate symmetry, which becomes obvious at domain-wall boundaries. In consequence, a simple top-layer trimer model is rendered insufficient. Instead, the finding of rotated trimers points at a more complex rearrangement of the surface, which generates the observed symmetry-breaking structural relaxation that leads to a chiral surface.