KSTAR edge probe diagnostics

KSTAR edge probe diagnostics
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DOI:
10.1063/1.1527242
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发表时间:
2003-03
影响因子:
1.6
通讯作者:
J. Bak;S. G. Lee
J. Bak;S. G. Lee
中科院分区:
工程技术4区
文献类型:
--
作者:
J. Bak;S. G. Lee

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KSTAR的边缘探针诊断(EPD)由固定的朗缪尔探针阵列、可移动和往复式朗缪尔探针组件组成。该探针阵列用于测量等离子体与表面相互作用区域(如内侧限制器和偏滤器)的等离子体基本参数及其极向分布。可移动和往复式探针组件分别用于测量刮除层区域和X点附近等离子体参数的空间分布。在这项工作中,目前的工程设计活动的KSTAR EPD的,从样品制造和性能测试的技术问题。
Edge probe diagnostics (EPDs) for the KSTAR consists of fixed Langmuir probe arrays, movable and reciprocating Langmuir probe assemblies. The probe array is designed to measure plasma basic parameters and their poloidal profiles in the plasma-surface interaction regions such as an inboard limiter and divertors. The movable and the reciprocating probe assemblies are designed to measure spatial profiles of plasma parameters in the scrape-off layer region and near the X point, respectively. In this work, the current engineering design activities for the KSTAR EPDs, and technical issues from sample fabrications and their performance tests are presented.