Data preparation and evaluation techniques for x-ray diffraction microscopy.
Data preparation and evaluation techniques for x-ray diffraction microscopy.
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DOI：
10.1364/oe.18.018598
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发表时间：
2010-08-30
期刊：
影响因子：
3.8
通讯作者：
Jacobsen C
中科院分区：
文献类型：
--
作者：
Steinbrener J;Nelson J;Huang X;Marchesini S;Shapiro D;Turner JJ;Jacobsen C
X 射线衍射显微镜数据的实验后处理通常既耗时又困难。这主要是因为即使已经重建了初步结果，对于是否仍然可以获得具有更一致的检索相位的更好结果没有明确的答案。我们在这里表明，数据分析的第一步，即从大量原始衍射数据中组装二维衍射图案，对于获得尽可能高的一致性的重建至关重要。我们开发了软件，可以自动执行此过程并产生一致准确的衍射图案。此外，我们还得出了一些常用来评估重建一致性的工具的有效性标准，即相位检索传递函数，并提出了一个改进的版本，该版本提高了判断重建质量的实用性。
The post-experiment processing of X-ray Diffraction Microscopy data is often time-consuming and difficult. This is mostly due to the fact that even if a preliminary result has been reconstructed, there is no definitive answer as to whether or not a better result with more consistently retrieved phases can still be obtained. We show here that the first step in data analysis, the assembly of two-dimensional diffraction patterns from a large set of raw diffraction data, is crucial to obtaining reconstructions of highest possible consistency. We have developed software that automates this process and results in consistently accurate diffraction patterns. We have furthermore derived some criteria of validity for a tool commonly used to assess the consistency of reconstructions, the phase retrieval transfer function, and suggest a modified version that has improved utility for judging reconstruction quality.