TEMPERATURE-DEPENDENT FATIGUE BEHAVIORS OF FERROELECTRIC Bi4−xLaxTi3O12 THIN FILMS
TEMPERATURE-DEPENDENT FATIGUE BEHAVIORS OF FERROELECTRIC Bi4−xLaxTi3O12 THIN FILMS
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DOI：
10.1080/10584580600657229
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发表时间：
2006-11
影响因子：
0.7
通讯作者：
Y. Wang;C. Zhu;X. Wu;J. Liu
中科院分区：
文献类型：
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作者：
Y. Wang;C. Zhu;X. Wu;J. Liu
本文研究了用溶胶-凝胶法制备的层状钙钛矿结构Bi 4 − xLaxTi 3 O 12（BLTx）薄膜的温度依赖性铁电疲劳行为。所有样品均观察到良好饱和的磁滞回线。室温下的开关疲劳试验表明，随着La掺杂量从0.25增加到0.75，材料的抗疲劳性能得到改善，这归因于氧空位扩散激活能的提高。室温附近和低温下的疲劳实验表明，在这两个温度范围内的疲劳行为分别由氧空位和空间电荷控制。分离这两个范围的温度点分别为BLT0.75和BLT1.0薄膜的约220 K和240 K。
ABSTRACT Temperature-dependent ferroelectric fatigue behaviors of layered-perovskite thin films Bi4−xLaxTi3O12 (BLTx), prepared by sol-gel method, were studied in this paper. Well-saturated hysteresis loops were observed for all samples. The switching fatigue testing at room temperature demonstrates that the fatigue resistance performance can be improved with increasing La-doping content from 0.25 to 0.75, which is attributed to the enhanced activation energy for diffusion of oxygen vacancies. The fatigue experiments close to room temperature and at low temperature indicate that the fatigue behaviors over the two temperature ranges are dominated by oxygen vacancies and space charges, respectively. The temperature point separating the two ranges is about 220 K and 240 K for BLT0.75 and BLT1.0 thin films, respectively.