Noise analysis of gamma-ray TES microcalorimeters with a demonstrated energy resolution of 52 eV at 60 keV
Noise analysis of gamma-ray TES microcalorimeters with a demonstrated energy resolution of 52 eV at 60 keV
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伽马射线 TES 微量热计的噪声分析，在 60 keV 下能量分辨率为 52 eV
DOI：
10.1109/tasc.2003.813975
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发表时间：
2003
期刊：
影响因子：
--
通讯作者：
S. Labov
中科院分区：
文献类型：
--
作者：
T. Miyazaki;J. Ullom;M. Cunningham;S. Labov
我们介绍了我们的/spl伽马/射线过渡边缘传感器（TES）微热量计的最新结果。我们已经展示了在60 keV下能量分辨率为52 eV的器件，该器件由高纯Sn吸收器和Mo/Cu多层薄膜TES组成。本文对这些设备进行了详细的噪声分析，并指出主要噪声源是设备源（热波动和约翰逊噪声）。我们的性能分析明确地包括了由于这些器件的复合几何形状和电热反馈（ETF）造成的噪声贡献。
We present recent results from our /spl gamma/-ray transition-edge sensor (TES) microcalorimeters. We have demonstrated an energy resolution of 52 eV at 60 keV with devices composed of a high-purity Sn absorber and a Mo/Cu multilayer thin-film TES. In this paper, we present a detailed noise analysis of these devices and show that the major noise sources are device originated (thermal fluctuation and Johnson noise). Our performance analysis explicitly includes the noise contribution due to the composite geometry of these devices and electro-thermal feedback (ETF).