Observation of interference fringes due to lattice distortion by resonant scattering X‐ray topography
Observation of interference fringes due to lattice distortion by resonant scattering X‐ray topography
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DOI：
10.1002/pssa.200675662
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发表时间：
2007-08
期刊：
影响因子：
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通讯作者：
R. Negishi;T. Fukamachi;M. Yoshizawa;K. Hirano;T. Kawamura
中科院分区：
文献类型：
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作者：
R. Negishi;T. Fukamachi;M. Yoshizawa;K. Hirano;T. Kawamura
在Laue情况下，在GaAs200反射的共振散射X射线形貌术中，观察到了缺陷周围晶格畸变引起的干涉条纹。当X射线极化率χ的虚部的傅里叶变换为零时，条纹的幅度可以达到最大。当入射角改变时，相对于缺陷的条纹位置移动，并且条纹间距作为到缺陷的距离的函数而改变。在χhi=0的情况下，通过观察入射角度变化时的像的位置，可以区分运动像和动力学像。(2007 Wiley-VCH Verlag GmbH&Co.KGaA，Weinheim)
The interference fringe caused by lattice distortion around a defect is observed in the resonant scattering X‐ray topography for the GaAs 200 reflection in the Laue case. The amplitude of the fringe can be maximized when the Fourier transform of the imaginary part of X‐ray polarizability χhi is zero. The fringe position relative to the defect shifts when the incident angle is varied, and the fringe spacing changes as a function of the distance from the defect. A kinematical image can be distinguished from a dynamical one by observing the image position when the incident angle is varied in the case of χhi = 0. (© 2007 WILEY‐VCH Verlag GmbH & Co. KGaA, Weinheim)