SEM & STEM multi-scale characterization of fatigue damage in CrCoNi medium-entropy alloy with fully recrystallized microstructure.
SEM & STEM multi-scale characterization of fatigue damage in CrCoNi medium-entropy alloy with fully recrystallized microstructure.
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扫描电镜
DOI:
10.1017/s1431927620020851
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发表时间:
2020
影响因子:
2.8
通讯作者:
Mills, M.J.
中科院分区:
文献类型:
--
作者:
Mazánová, V.;Heczko, M.;Slone, C.E.;Kuběna, I.;Tobiáš, J.;George, E.P.;Kruml, T.;Polák, J.;Mills, M.J.