Calibration of a computer-controlled precision wavemeter for use with pulsed lasers.
Calibration of a computer-controlled precision wavemeter for use with pulsed lasers.
复制标题
用于脉冲激光器的计算机控制精密波长计的校准。
DOI：
10.1364/ao.38.002486
复制
发表时间：
1999
期刊：
影响因子：
1.9
通讯作者：
J. Keto
中科院分区：
文献类型：
--
作者：
P. Bhatia;C. McCluskey;J. Keto
本文介绍了一种用于监测脉冲（以及连续）激光源高精度调谐的脉冲波长计的设计。该装置是由不同板间距的镀银法布里-珀罗标准具组合而成。这些标准具提供待测量波长的逐步细化。波长计由计算机通过CAMAC接口控制，其测量可见光中的绝对波长，精度为2/10（8）。数据采集和计算所需的时间，以测量与一个单一的2 MHz的CPU的细化波长小于100毫秒。我们描述了在波长范围400-850 nm的仪器的校准。我们获得所需的校准线锁定激光碘，铀，铷，铯的超精细跃迁。描述了减少系统校准所需的校准线数量的方法。预期的波长相关的相移的银涂层进行比较，测量标准具校准后。由于光学像差或使用质心来测量条纹位置，差异大于预期。
The design of a pulsed wavemeter to monitor the high-precision tuning of pulsed (as well as cw) laser sources is presented. This device is developed from a combination of silver-coated Fabry-Perot etalons with various plate spacings. These etalons provide stepwise refinement of the wavelength to be measured. The wavemeter is controlled by a computer through a CAMAC interface, which measures the absolute wavelength in the visible with an accuracy of 2 parts in 10(8). The time required for data acquisition and computation to measure the refined wavelength with a single 2-MHz CPU is less than 100 ms. We describe the calibration of the instrument over the wavelength range 400-850 nm. We obtain the required calibration lines by locking lasers on hyperfine transitions of iodine, uranium, rubidium, and cesium. Methods to reduce the number of calibration lines required for calibration of the system are described. The expected wavelength-dependent phase shift of the silver coatings is compared with that measured for the etalon following calibration. The differences are larger than expected because of either optical aberations or the use of centroids to measure the fringe position.