EXOS-D (AKEBONO) very low frequency plasma wave instruments (VLF)
EXOS-D (AKEBONO) very low frequency plasma wave instruments (VLF)
复制标题
EXOS-D (AKEBONO) 极低频等离子波仪器 (VLF)
DOI：
10.1109/36.563267
复制
发表时间：
1997
期刊：
影响因子：
--
通讯作者：
Hidetaka Oki
中科院分区：
文献类型：
--
作者：
K. Hashimoto;I. Nagano;Masayuki K. Yamamoto;T. Okada;I. Kimura;H. Matsumoto;Hidetaka Oki
Akebono （EXOS-D）卫星自1989年2月21日发射以来，一直成功地观测地球的磁层。卫星上的VLF仪器的目的是研究与加速极光粒子相关的等离子体波的行为、波粒相互作用机制以及哨声模式波在磁层中的传播特性。该仪器不仅通过宽带接收器测量了高达15khz的VLF波的动态谱，而且还测量了它们的绝对场强、波法矢量和波印廷矢量。发送带宽约为50 Hz至12.5 kHz的两个电分量和三个磁分量来测量波的法向量和坡印亭向量。通过测量天线阻抗来确定正确的绝对电场强度。该仪器已成功地测量了波的光谱，波的法向量。波印亭矢量，精确波强，天线阻抗等。本文详细介绍了各种仪器的特点，特别是波印廷通量分析仪的特点。已取得的科学成果也进行了审查。
The Akebono (EXOS-D) satellite has been successfully observing the Earth's magnetosphere since it was launched on February 21, 1989. The objectives of VLF instruments on board the satellite were to investigate the behavior of plasma waves associated with accelerated auroral particles, wave-particle interaction mechanisms, and propagation characteristics of whistler-mode waves in the magnetosphere. The instruments measured not only the dynamic spectra of VLF waves up to 15 kHz by a wideband receiver, but also their absolute field intensities, wave normal vectors, and Poynting vectors. Two electric and three magnetic components with a bandwidth of about 50 Hz up to 12.5 kHz are sent to measure the wave normal vectors and Poynting vectors. The antenna impedance is measured to determine the correct absolute electric field intensities. The instruments have successfully measured the wave spectra, the wave normal vectors. Poynting vectors, the precise wave intensities, the antenna impedance, etc. The present paper describes the unique features of the instruments, especially the Poynting flux analyzers in more detail. Obtained scientific results are also reviewed.
DOI：
10.5636/jgg.42.411
发表时间：
1990
期刊：
Journal of geomagnetism and geoelectricity
影响因子：
--
作者：
H. Oya;A. Morioka;Kaori Kobayashi;M. Iizima;T. Ono;H. Miyaoka;Toshimi Okada;T. Obara
通讯作者：
H. Oya;A. Morioka;Kaori Kobayashi;M. Iizima;T. Ono;H. Miyaoka;Toshimi Okada;T. Obara