Three-dimensional imaging by deconvolution microscopy
Three-dimensional imaging by deconvolution microscopy
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DOI：
10.1006/meth.1999.0873
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发表时间：
1999-11-01
期刊：
影响因子：
--
通讯作者：
Conchello, JA
中科院分区：
文献类型：
--
作者：
McNally, JG;Karpova, T;Conchello, JA
去卷积是一种用于减少三维（3D）显微镜图像中的散焦荧光的计算方法。它原则上可以应用于任何类型的显微镜图像，但最常用于改善传统荧光显微镜的图像。与其他形式的3D光学显微镜相比，如共焦显微镜，去卷积显微镜的优点是它可以在非常低的光水平下完成，从而使光敏活体标本的多焦平面成像长时间。在这里，我们讨论的原理去卷积显微镜，描述不同的计算方法去卷积，并讨论解释去卷积图像，特别强调：可能会出现什么样的文物。(C)北京：科学出版社.
Deconvolution is a computational method used to reduce out-of-focus fluorescence in three-dimensional (3D) microscope images. It can be applied in principle to any type of microscope image but has most often been used to improve images from conventional fluorescence microscopes. Compared to other forms of 3D light microscopy, like confocal microscopy, the advantage of deconvolution microscopy is that it can be accomplished at very low light levels, thus enabling multiple focal-plane imaging of light-sensitive living specimens over long time periods. Here we discuss the principles of deconvolution microscopy, describe different computational approaches for deconvolution, and discuss interpretation of deconvolved images with a particular emphasis on:what artifacts may arise. (C) 1999 Academic Press.