Thin film dielectric microstrip kinetic inductance detectors
Thin film dielectric microstrip kinetic inductance detectors
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薄膜电介质微带动感电感探测器
DOI：
10.1063/1.3314281
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发表时间：
2010
影响因子：
4
通讯作者：
J. Zmuidzinas
中科院分区：
文献类型：
--
作者：
B. Mazin;D. Sank;S. McHugh;E. Lucero;A. Merrill;J. Gao;D. Pappas;D. Moore;J. Zmuidzinas
微波动力学电感探测器（英语：Microwave kinetic inductance detector），简称MKID，是一种低温探测器，在微波频率下表现出固有的频域复用。我们提出了第一个理论和测量的MKID基于微带传输线谐振器。这些谐振器的介电损耗和噪声特性的一个完整的表征进行，并同意与导出的理论。在10 Hz时，具有竞争力的噪声等效功率为5×10^（−17）W Hz^（−1/2）。该谐振器表现出最高的品质因数已知的微带谐振器与沉积的薄膜电介质。
Microwave kinetic inductance detectors, or MKIDs, are a type of low temperature detector that exhibit intrinsic frequency domain multiplexing at microwave frequencies. We present the first theory and measurements on a MKID based on a microstrip transmission line resonator. A complete characterization of the dielectric loss and noise properties of these resonators is performed, and agrees well with the derived theory. A competitive noise equivalent power of 5×10^(−17) W Hz^(−1/2) at 10 Hz has been demonstrated. The resonators exhibit the highest quality factors known in a microstrip resonator with a deposited thin film dielectric.