IR drop and ground bounce awareness timing model

IR drop and ground bounce awareness timing model
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IR 压降和地弹感知时序模型

DOI:
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发表时间:
2005
期刊:
IEEE Computer Society Annual Symposium on VLSI
影响因子:
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通讯作者:
Martin D. F. Wong
Martin D. F. Wong
中科院分区:
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文献类型:
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作者:
Muzhou Shao;Youxin Gao;L. Yuan;Martin D. F. Wong

文献摘要

被引文献

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随着集成电路工艺规模的缩小,IR下降/地反弹的影响变得越来越显著。IR跌落和地反弹会影响栅极驱动能力,降低IC性能,甚至会使IC发生功能故障。因此,为了提高电路的可靠性,有效而准确地捕获这种效应是至关重要的。在本文中,我们提出了一种考虑IR下降和地面反弹的定时模型。我们的模型可以直接从常规时序分析中使用的现有定时表(例如Synopsys.db或CLF表)中推导出来。与传统的k-因子方法相比,该方法不需要SPICE网表和SPICE模拟。此外,我们的模型的精度要好于k-因子法。
As the IC technology scales down, the effect of IR drop/ground bounce becomes increasingly significant. IR drop and ground bounce can compromise the gate driving capability and degrade the IC performance, and even can make IC functional failures. Hence, it is crucial to capture this effect efficiently and accurately in order to improve circuit reliability. In this paper, we proposed a timing model with consideration of IR drop and ground bounce. Our model can be derived directly from the existing timing tables (e.g. Synopsys.db or CLF tables), which are used in normal timing analysis. Compared with the traditional k-factor approach, our method does not require SPICE netlist and SPICE simulations. Moreover, the accuracy of our model is better than k-factor approach.